描述The ADS1672 is a high-speed, high-precision analog-to-digital converter (ADC). Using an advanced delta-sigma () architecture, it operates at speeds up to 625kSPS with outstanding ac performance and dc accuracy. The ADS1672 ADC is comprised of a low-drift, chopper-stabilized modulator with out-of-range detection and a dual-path programmable digital filter. The dual filter path allows the user to select between two post-processing filters: low-latency or wide-bandwidth. The low-latency filter settles quickly in one cycle, for applications with large instantaneous changes, such as a multiplexer. The wide-bandwidth path provides an optimized frequency response for ac measurements with a passband ripple of less than 0.001dB, stop band attenuation of 86dB, and a bandwidth of 305kHz. The ADS1672 is controlled through I/O pins—there are no registers to program. A dedicated START pin allows for direct control of conversions: toggle the START pin to begin a conversion, and then retrieve the output data. The flexible serial interface supports data readback with either standard CMOS and LVDS logic levels, allowing the ADS1672 to directly connect to a wide range of microcontrollers, digital signal processors (DSPs), or field-programmable grid arrays (FPGAs). The ADS1672 operates from an analog supply of 5V and digital supply of 3V, and dissipates 350mW of power. When not in use, the PDWN pin can be used to power down all device circuitry. The device is fully specified over the industrial temperature range and is offered in a TQFP-64 package.特性AC Performance: 107dB of Dynamic Range at 625kSPS 115.5dB of Dynamic Range at 78kSPS –113dB THD DC Accuracy: 3ppm INL 2µ/°C Offset Drift 2ppm/°C Gain Drift Programmable Digital Filter with User-Selectable Path: Low-Latency: Completely settles in 5.5µs Wide-Bandwidth: 305kHz BW with flat passband Flexible Read-Only Serial Interface: Standard CMOS Serialized LVDS Easy Conversion Control with START Pin Out-of-Range Detection Supply: Analog +5V, Digital +3V Power: 350mW APPLICATIONS Automated Test Equipment Vibration Analysis Sonar Test and Measurement All other trademarks are the property of their respective owners